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Tag: Chipmetrics

Chipmetrics Launches New Test Chips for Advanced Atomic Layer Processes

Pressmeddelanden Pressmeddelanden -
Finnish 3D thin film semiconductor metrology specialist launches new PillarHall LHAR5 test chip with 100 nanometer gap height, complements its metrology solution with new ASD-1 chip for Area Selective Deposition.

Chipmetrics secures 2.4 million EUR seed funding round

Pressmeddelanden Pressmeddelanden -
Chipmetrics Ltd, the Atomic Layer Deposition (ALD) technology company and a pioneer in 3D ultra-high aspect ratio test elements for metrology of semiconductor and advanced...
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